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Semiconductor and Component Test

Check here for parameter analyzers for characterizing materials, processes and semiconductor devices, source measure units for IV characterization of passive (currentless) components such as diodes, resistors and capacitors, and test systems for SiC (silicon carbide) and GaN (gallium nitride) power semiconductors. Find the right instrument for material and component characterizations in maintenance, design or quality control in our category Semiconductor and Component Test.

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501 products
PZ2100A
On Request
Delivery time upon request
CS-8200
On Request
Delivery time upon request
NGU201
Bundle
€7,800.00
Delivery time upon request
2450
€7,580.00
Reordered - in stock. Delivery time on request
TRX-1100V-CONN
€131.00
4 in stock. Ready to ship in 1 business day
4200A-SCS
On Request
Delivery time upon request
CS-8500
On Request
Delivery time upon request
CS-8020
On Request
Delivery time upon request
Quality at a Special Price.

Inspected demo units and clearance sales – available immediately and backed by a warranty.

B2902B
On Request
1 in stock. Ready to ship in 1 business day
2470
€13,600.00
Reordered - in stock. Delivery time on request
934-068-101
€7.25
Delivery time upon request
4200-SMU
€10,800.00
Delivery time upon request
10834A
€54.04
3 in stock. Ready to ship in 1 business day
934-068-100
€7.25
Delivery time upon request
934-095-100
€8.25
Delivery time upon request
2606B
€35,600.00
Delivery time upon request
2510-AT
€12,100.00
Delivery time upon request
2520.
On Request
Delivery time upon request

Wafer Probe Station

Probing solutions for fast wafer tests.

2401
€6,080.00
Reordered - in stock. Delivery time on request
2510.
€10,300.00
Delivery time upon request