#statusMessage#
Do you want to start the comparison now?
#statusMessage#
Do you want to start the comparison now?
Without reliable communication, safe operation is impossible. In the aerospace industry, failures are not an option. At ...
In safety-critical development and manufacturing processes, the test architecture determines quality, cost efficiency, a...
Increasing efficiency requirements in vehicles, data centers, and industry are driving new vehicle electrical system and...
Early prevention, comprehensive certification, targeted troubleshooting. In every area of your data center, measuring in...
Manufacturer number: 2401.
| Weight (kg): | 4.8 |
|---|
A source measurement unit (SMU) supplies your DUT (Device Under Test) with a defined current or a defined voltage and simultaneously measures the behavior of the test object as a measuring device. Depending on the measuring range and resolution of the integrated digital multimeter down to the µV and pA range, a design in the development stage or the quality in the production environment can be assessed.
With the SourceMeter 2401 with integrated 6½-digit digital multimeter, multitouch-capable display and integrated math functions, standard calculations can be carried out and displayed automatically. In addition, histograms can be created to e.g. B. to determine variances. The SMU 2401 can be operated without an external PC, so that your results are available very quickly, which is an important aspect especially when testing in the production environment.
Keithley Instruments is a renowned manufacturer of high-precision electrical measuring instruments and systems for research, development, and production, particularly in the semiconductor industry, process monitoring, and electronics manufacturing. The portfolio includes Source Measure Units (SMU instruments), multimeters, data loggers, parameter analyzers, and DC power supplies for measurement requirements ranging from nanovolts to gigahertz.
Optimizing measurement data acquisition with the data logger. Products are becoming more feature-rich—and as a result, t...