Voltage and current measurements with fast, precise measurement results: The Source Measure Unit (SMU) B2902B of the B2900B / BL series from Keysight is a compact, precise and cost-effective solution for the development area and the test field. The precision source measuring unit is particularly suitable for IV measurement applications that require particularly high measurement resolution and accuracy. The integration of source and measuring unit in one device increases your test throughput.
Key Features:
- Integrated function as source and measuring device: simple and precise measurement of current and voltage with just one device and without manual changes to the connections
- Large current and voltage measuring range: for a wide range of applications in research and development, training and production, including standardized high voltage and high current measurements
- Outstanding measurement performance: very high source and measurement resolution for precise low-level measurements as well as high measurement speed for increased test throughput and cost efficiency
- Innovative GUI and 4.3-inch LCD color display: graphical and numerical representation of the measurement results simplifies troubleshooting and characterization
- Integrated AWG measurement functionality: Arbitrary signal generation for waveforms with up to 100,000 steps and sweep functions support the characterization of devices depending on the applied voltage / current
- SCPI programming for device control: two SCPI instruction sets, conventional and standard, allow compatibility with older SMU models and maximize the performance of the B2900B / BL series
The SMU series B2900B / BL offers a total of six models with an output voltage of up to 210 V and a maximum output current of 3 A DC or 10.5 A pulsed. This enables a wide variety of applications with just a single device. The high measurement resolution of up to 10 fA / 100 nV enables the precise characterization of even weak signal events. The color display supports graphic and numeric displays. Your measurement results are therefore optimally legible, which makes troubleshooting easier and can increase productivity and cost efficiency.
Application examples:
- Test of optical components: laser / photodiodes
- Test of organic components: OLED (Organic Light Emitting Diode)
- Test of solar cells and batteries
- Characterization of materials from nanotechnology
- Test of power management devices: linear regulator LDO (low-dropout)
- Testing of semiconductor components: diodes, laser diodes, LEDs, sensors, FETs, transistors, ICs, resistors, varistors, thermistors, switches, etc.
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