Digital acquisition on 16 channels: If many interfaces have to be verified, the MSO70000 series with four analog and 16 logical channels enables efficient time measurements between the channels. With a time resolution of 80 ps for troubleshooting digital and analog signals, precise measurements on up to 20 channels are possible at the same time. High-speed logic probes with bandwidths up to 2.5 GHz are available for today's fast digital signals. With the iCapture digital-analog multiplexer function, the analog properties of all 16 signals connected to the digital channels can be quickly displayed and verified. If the signal meets expectations, the test can be continued in a purely digital representation.
A dedicated solution to today's complex high-speed designs:
The mixed signal oscilloscopes of the MSO70000 series are particularly well suited for high-speed serial designs, since they already contain many of the serial analysis functions for verification and characterization as standard: serial bit pattern triggers for real-time triggering on serial bit patterns and protocol decoding integrated clock recovery, high-precision jitter, timing and eye diagram analysis and comprehensive analysis algorithms as well as an extensive selection of over 150 masks for mask testing to verify compliance of serial communication standards.
Extended trigger functions:
The MSO / DPO70000 series oscilloscopes offer extensive options for protocol analysis of high-speed serial buses. The convenient pinpoint triggering minimizes the time required to detect signal anomalies and thus enables efficient and quick troubleshooting. Bit pattern triggering enables logical qualification that controls when to look for errors and ignore events. In the MSO70000 series, the pinpoint trigger functions are improved by bit pattern triggers up to 20 bits wide. This makes it easier to isolate the specific system state and the analog events that cause system errors. The comfort triggers of the MSO70000 series also include the "Digital A then Analog B" function, which identifies a specific digital pattern or a system state and then waits for an analog event to occur, e.g. B. a run pulse to trigger the acquisition.
Application areas:
- Design verification including signal integrity, jitter and timing analysis
- Design characterization of complex high-speed designs
- Certification test of serial data streams according to industry standards
- Memory bus analysis and troubleshooting
- Start-up and power supply testing on prototypes
- Identification and investigation of transient phenomena
- Production test of complex systems
- Spectral analysis of transient or broadband RF signals
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