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It is widely expected that wide bandgap (WBG) devices—using silicon carbide (SiC) and gallium nitride (GaN) transistors—will largely replace conventional silicon-based power MOSFETs and IGBTs in power electronics and motor drives, due to their higher switching speeds and lower power losses. New power converter designs based on SiC and GaN MOSFETs require careful design and testing to optimize performance.
Double pulse testing (DPT) efficiently measures a range of critical parameters during turn-on, turn-off, and recovery events. While these measurements can be set up and executed manually, automation accelerates the process and ensures accurate, consistent results. The Wide Bandgap Double Pulse Test Software Application (5-WBG-DPT), available for Tektronix MSO 5B series oscilloscopes, automates device setup and performs standard energy loss and timing measurements. Intelligent differential voltage and current probes that communicate directly with the oscilloscope further simplify the setup.
This test solution simplifies the analysis of wide bandgap systems and enables teams to quickly measure key WBG-DPT parameters.
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