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How Thermography Enhances Manufacturing. Machine stoppages, component overheating, or electrical faults—unplanned downti...
Disturbances in the power grid often go unnoticed until systems shut down or equipment fails. Regular power quality asse...
In this practical checklist you will learn how to calibrate your measuring and test instruments effectively – simply, ef...
Modern oscilloscopes of the MXO Series from Rohde & Schwarz enable precise analysis and optimization of electric drivetr...
As data rates continue to increase in today’s state-of-the-art high-speed digital designs, timing budgets are decreasing. Ensuring that serial data signals are valid and stable when receivers sample the data often requires an understanding of the effects of the various components of jitter that may contribute to decreased valid data windows. The primary measurement tool used today by hardware design engineers to capture and view waveform jitter is an oscilloscope. Many of today’s higher performance oscilloscopes also provide optional jitter analysis measurement capabilities that can not only be used to view jitter in different display formats, but they can also quantize the various components of jitter.
Learn with this application note from Keysight how Infiniium Series Oscilloscopes give various display formats to view jitter measurements from horizontal waveform histograms to jitter spectrum waveforms.