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Our electromagnetic environment is heavily burdened due to the multitude of transmitters and sources of interference pre...
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Manufacturer number: XF1
The probes from the XF1 set contain electrically shielded measuring heads, which were designed for high-frequency magnetic field measurements on electronic assemblies, components and IC pins.
The passive probes are connected to the 50 ohm input of a spectrum analyzer via cables with SMA connectors and enable comparative magnetic field and current measurements in the frequency range from 30 MHz to 6 GHz.
Near field probe set XF1
The spectrum analyzer is an indispensable piece of measuring equipment in development, production or quality assurance. ...