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Semiconductor and Component Test

Check here for parameter analyzers for characterizing materials, processes and semiconductor devices, source measure units for IV characterization of passive (currentless) components such as diodes, resistors and capacitors, and test systems for SiC (silicon carbide) and GaN (gallium nitride) power semiconductors. Find the right instrument for material and component characterizations in maintenance, design or quality control in our category Semiconductor and Component Test.

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513 products
2510.
On Request
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10833D
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Reordered - in stock. Delivery time on request
2460
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2 in stock. Ready to ship in 1 business day
N6783A
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2601B-PULSE
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2502 / E
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N1412A
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Delivery time upon request
783539-01
€33.00
3 in stock. Ready to ship in 1 business day