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Semiconductor and Component Test

Check here for parameter analyzers for characterizing materials, processes and semiconductor devices, source measure units for IV characterization of passive (currentless) components such as diodes, resistors and capacitors, and test systems for SiC (silicon carbide) and GaN (gallium nitride) power semiconductors. Find the right instrument for material and component characterizations in maintenance, design or quality control in our category Semiconductor and Component Test.

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501 products
930-113-101
€6.05
Delivery time upon request
PX0104A
On Request
Delivery time upon request
4200A-CVIV
€9,870.00
Delivery time upon request
934-095-104
€8.25
Delivery time upon request
TA090
€8.00
Delivery time upon request
P01102101Z
€51.00
1 in stock. Ready to ship in 1 business day
934-069-100
€10.45
Delivery time upon request
N1294A
On Request
Delivery time upon request
P01295491Z
€22.00
Ready to ship in 5 to 10 business days
A600010
Exclusive
€100.00
Delivery time upon request
8497K
On Request
Delivery time upon request
11581A
On Request
Delivery time upon request
XKM-2
€8.25
Delivery time upon request
934-064-103
€7.15
Delivery time upon request
HA-Z362
€75.00
Delivery time upon request
4225-PMU
On Request
Delivery time upon request
J7201B-001
On Request
Delivery time upon request
2657A-PM-200
€2,530.00
Delivery time upon request
RDL50
€1,180.00
Delivery time upon request
934-060-100
€4.95
Delivery time upon request
RS9010A-CASE
On Request
Delivery time upon request
8495B
On Request
Delivery time upon request
TA261
€76.00
Delivery time upon request
1CM007A
On Request
Delivery time upon request