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Semiconductor and Component Test

Check here for parameter analyzers for characterizing materials, processes and semiconductor devices, source measure units for IV characterization of passive (currentless) components such as diodes, resistors and capacitors, and test systems for SiC (silicon carbide) and GaN (gallium nitride) power semiconductors. Find the right instrument for material and component characterizations in maintenance, design or quality control in our category Semiconductor and Component Test.

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506 products
934-076-101
€10.45
Delivery time upon request
U2921A
On Request
5 in stock. Ready to ship in 1 business day
934-072-103
€7.15
Delivery time upon request
783469-01
€83.00
Delivery time upon request
N9356B
On Request
Delivery time upon request
10833G
€174.00
Delivery time upon request
1CN003A
On Request
Delivery time upon request
PX0110A
€227.00
Delivery time upon request
934-070-100
€6.15
Delivery time upon request
USB 3.0 SuperSpeed isolator up to 1 kV, USB 3.0 (141117)
€239.00
33 in stock. Ready to ship in 1 business day
1CM028A
On Request
1 in stock. Ready to ship in 1 business day
934-065-100
€8.25
Delivery time upon request
8495D
On Request
Delivery time upon request
934-068-103
€7.25
Delivery time upon request
BP880
-17 % €19.92 €24.00
Delivery time upon request