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Semiconductor and Component Test

Check here for parameter analyzers for characterizing materials, processes and semiconductor devices, source measure units for IV characterization of passive (currentless) components such as diodes, resistors and capacitors, and test systems for SiC (silicon carbide) and GaN (gallium nitride) power semiconductors. Find the right instrument for material and component characterizations in maintenance, design or quality control in our category Semiconductor and Component Test.

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506 products
PX0103A
On Request
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84906L
On Request
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N1416A
On Request
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A662005
Exclusive
€40.00
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J7201C-908
On Request
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934-070-101
€6.15
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N1412B
€727.00
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J7201A-002
On Request
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198506-01
€40.00
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934-065-102
€8.25
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PM9093 / 001
-17 % €92.13 €111.00
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934-072-102
€7.15
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8493C
On Request
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8495G
On Request
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8010
€15,400.00
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AC280
On Request
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8496A
On Request
Delivery time upon request