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Semiconductor and Component Test

Check here for parameter analyzers for characterizing materials, processes and semiconductor devices, source measure units for IV characterization of passive (currentless) components such as diodes, resistors and capacitors, and test systems for SiC (silicon carbide) and GaN (gallium nitride) power semiconductors. Find the right instrument for material and component characterizations in maintenance, design or quality control in our category Semiconductor and Component Test.

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506 products
934-058-104
€4.25
9 in stock. Ready to ship in 1 business day
934-070-104
€6.15
Delivery time upon request
1CN020A
On Request
Delivery time upon request
8495A
On Request
Delivery time upon request
1CP014A
On Request
Delivery time upon request
TA311
€6.00
Delivery time upon request
N1294A-012
On Request
Delivery time upon request
PX0107A
€4,391.00
Delivery time upon request
973-995-101
€10.45
Delivery time upon request
934-074-102
€7.25
Delivery time upon request
934-067-104
€6.85
Delivery time upon request
890-502-300
€104.50
Delivery time upon request
934-067-102
€6.85
Delivery time upon request
N2881A
On Request
Ready to ship in 5 to 10 business days
934-065-103
€8.25
Delivery time upon request