Use the NI PXIe-4190 to measure and test inductance, capacitance, and resistance (LCR) of electronic devices. The module includes an LCR meter with fF class capacitance measurements and a precision SMU (Source Measure Unit) with fA class current measurements. The PXIe-4190 Meter can be used in automated test systems (CV/IV) for semiconductor applications including IPD (Integrated Passive Device), MEMs (Micro Electro Mechanical Systems), Multi-Layer Ceramic Capacitors (MLCC), and parametric tests. In addition, the National Instruments PXIe-4190 is supported by the NI DCPower device driver, which includes APIs for LabVIEW, C, C# .NET, Python, and other programming languages.