The FIU (Fault Insertion Unit) PXIe-2512 is suitable for hardware-in-the-loop (HIL) applications and reliability testing of electronic components. Each module has a set of feed-through channels that are opened or short-circuited to one or more fault buses can be. This architecture can be used to simulate open or broken connections as well as channel-by-channel for short circuits between pins, to battery voltages and to ground. Together with the LabVIEW Real ‑ Time Module, the PXIe ‑ 2512 is particularly suitable for validating the reliability of control systems such as B. ECUs and FADECs.
Product features:
- Bus type: PXIe
- Number of channels: 7
- Relay type: FET relay
- Maximum switching voltage (DC): 50 V
- Maximum switching current (DC): 10 A.
- Switching bandwidth: 800 kHz