The FIU (Fault Insertion Unit) PXIe-2512 is suitable for hardware-in-the-loop (HIL) applications and reliability testing of electronic components. Each module has a set of feed-through channels that are opened or short-circuited to one or more fault buses can be. This architecture can be used to simulate open or broken connections as well as channel-by-channel for short circuits between pins, to battery voltages and to ground. Together with the LabVIEW Real ‑ Time Module, the PXIe ‑ 2512 is particularly suitable for validating the reliability of control systems such as B. ECUs and FADECs.
 Product features:
-  Bus type: PXIe
-  Number of channels: 7
-  Relay type: FET relay
-  Maximum switching voltage (DC): 50 V
-  Maximum switching current (DC): 10 A.
-  Switching bandwidth: 800 kHz