The RXX-0030 PXI-XJLink2 from XJTAG is a high-performance JTAG boundary-scan controller designed for integration into PXI- and CompactPCI-based test systems. The module combines the functions of an XJLink2 controller with a standardized 3-U PXI plug-in card and enables the connection of up to four JTAG chains.
Thanks to its freely configurable pinout and adjustable signal voltages, the controller can be flexibly adapted to different devices under test and PCB designs. The configurable 20-pin connector can be tailored to the pinout of the respective assembly. This reduces the amount of wiring required and makes it easier to use the same test hardware in different projects.
The PXI-XJLink2 is suitable for development and laboratory applications as well as for automated production, programming, and functional tests. Typical applications include boundary-scan testing, rapid programming of flash memory, control of external components, and monitoring of voltages and frequencies at the inputs and outputs.
Using the included virtual instruments and standardized .NET and COM interfaces, the module can be integrated into NI LabVIEW, LabWindows/CVI, and TestStand, as well as into custom applications. Standalone licensing also allows operation in a separate PXI rack without permanently tying the license to a specific PC.
Product Features:
- Product Type: PXI/CompactPCI JTAG Boundary-Scan Controller
- Part Number: RXX-0030
- Bus Interface: 32-bit PXI/CompactPCI interface
- Form Factor: 3U
- Number of supported JTAG chains: up to 4
- Front connector: configurable 20-pin connector
- Function of all I/O pins freely configurable
- Maximum TCK clock frequency: 166 MHz
- Two independently configurable voltage ranges
- Adjustable signal voltage: 1.1 V to 3.3 V in 0.1 V increments
- JTAG signals with 5 V tolerance
- Adjustable signal rise time and drive strength
- Automatic signal propagation time and skew control
- Integrated voltmeter on all I/O pins
- Voltage measurement range: 0 V to 5 V
- Integrated frequency counter on all I/O pins
- Frequency measurement range: 1 Hz to 200 MHz
- Selectable measurement intervals: 1 ms, 10 ms, 50 ms, 100 ms, 500 ms, 1 s, 5 s, and 10 s
- Visual indication of test status
- Free pins can be used for status output or to control external components
- I/O pins can be used as universal inputs and outputs during testing
- Support for fast flash programming
- NI LabVIEW™ virtual instruments available
- Integration via .NET and COM interfaces
- Compatible with other XJLink2 controllers
- Standalone or network-based licensing available