Press Release

The Agenda Is Set: The M-Day 2026 Addresses the Growing Testing Requirements in Power Electronics.

At Measurement Day (M-Day) on April 22, 2026, in Nuremberg, dataTec will present current solution approaches for users who face concrete testing, inspection, and automation requirements in practical applications. The focus is on increasing demands for efficiency, power quality, and electromagnetic compatibility (EMC), which are placing growing pressure on developers and industry.

The agenda combines technical presentations, application-oriented use cases, and live demonstrations, with ample opportunity for direct exchange with experts. At the opening, Cinergia, as a new partner of dataTec, will demonstrate how Power Hardware in the Loop (PHIL) can be used to integrate real-time simulation and physical hardware into flexible, scalable test environments. This approach reduces development times and enables realistic validation. Subsequently, Flir will highlight the use of thermography as a non-destructive testing method in electronics. Keysight will provide insights into modern power analysis methods: from efficiency and power loss measurements to power quality evaluation, users will learn how switched-mode power supplies can be comprehensively and reproducibly characterized, including automated measurement sequences to increase efficiency in the test process.

In the afternoon, AC and DC solutions for test automation and EMC pre-compliance testing with TDK-Lambda will be in focus. Among other topics, practical implementation of IEC standards will be demonstrated, along with how high-performance analog amplifiers and modern DC technologies support high-speed testing. Finally, dataTec will demonstrate in a practical manner how electromagnetic compatibility (EMC) can be visualized directly on the PCB using an automatic 4D scanner. This provides a valuable basis for early identification and targeted elimination of interference sources. Time is scheduled between sessions for networking, technical exchange, and addressing individual questions. Participation is free of charge; however, registration is required due to the limited number of places: