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Wayne Kerr 6430B | Precision Component Analyzer, 20 Hz - 500 kHz

Manufacturer number: 6430B

6430B
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Highlights Technical Data Documents / Downloads Description Related Articles

Wayne Kerr 6430B | Precision component analyzer, 20 Hz - 500 kHz.

  • Frequency range: 20 Hz ... 500 kHz (6440B to 3 MHz)
  • Basic accuracy: 0.02%
  • C, L, R, X, G, B, D, Q, Z, Y, Ø - parallel or serial
  • Measuring speed: 4 speeds adjustable
  • Interfaces: GPIB, BINNING
  • Display: LCD 320 x 240

Technical Data

Documents & Downloads

Datasheet
pdf | 0.36 MB
Datasheet
pdf | 0.36 MB

Description

6430B | Precision Component Analyzer, 20 Hz - 500 kHz

The Wayne Kerr 6430B and 6440B Precision Component Analyzers enable thorough and accurate inspection of all passive components with high resolution.

The 6430B and 6440B Component Analyzers enable you to quickly and automatically test capacitors in a production environment. Select measurements from each instrument area and perform up to eight different tests on each component. Tolerance subjects can be selected for each test.

For capacitor manufacturers in particular, the instruments offer the possibility of carrying out both rapid automatic production tests and complete design characterization. Users include passive component developers, manufacturing tests, materials design and testing, and circuit designers who evaluate component properties.

The resonance frequency can be calculated automatically for each component together with its corresponding series or parallel connection for this frequency. Both devices are designed for the high-performance testing of components with a basic accuracy of 0.02%. The Wayne Kerr 6430B offers you a frequency range of up to 500 kHz, while the 6440B is designed for 3 MHz.

Product features:

  • Characterizes components from 20Hz to 3MHz (depending on the model)
  • Resonance frequency search
  • Fast capacitor measurement
  • High accuracy with D (loss factor) measurement
  • Graphic curve display

Accessoires

1EV1006
Wayne Kerr
1EV1006
Test holder for components, 4 terminals, 20 Hz - 3 MHz, length: 1 m
Delivery time upon request
On Request
1EV1505
Wayne Kerr
1EV1505
Alligator clip cable for LCR meter, 4 terminals, length: 60 cm
Delivery time upon request
On Request
1EV1905A
Wayne Kerr
1EV1905A
SMD Probe Lead, 2 terminal
Delivery time upon request
On Request
1EV1905X
Wayne Kerr
1EV1905X
SMD Probe Lead with 1J1023 adapter 4 to 2 terminal
Delivery time upon request
On Request
1EVA40100
Wayne Kerr
1EVA40100
Kelvin measuring cable with small terminals, 4 terminals, 20 Hz - 3 MHz, length: 60 cm
Delivery time upon request
On Request
1EVA40120
Wayne Kerr
1EVA40120
Tweezers test adapter for SMD, 4 terminals, 20 Hz - 3 MHz, length: 1.5 m
Delivery time upon request
On Request
1EVA40150
Wayne Kerr
1EVA40150
Kelvin measuring cable with small terminals, Economy 4 terminal, 20 Hz - 3 MHz, length: 60 cm
Delivery time upon request
On Request
1EVA40180
Wayne Kerr
1EVA40180
Kelvin measuring cable with large terminals, 4 terminals, 20 Hz - 3 MHz, length: 60 cm
Delivery time upon request
On Request
1J1012
Wayne Kerr
1J1012
Test adapter for SMD, 2 terminals, 20 Hz - 120 MHz, for 1608 to 7451 (metric)
Delivery time upon request
On Request
1J1014
Wayne Kerr
1J1014
Test adapter for SMD, 4 terminals, 20 Hz - 120 MHz, for 1608 to 7451 (metric)
Delivery time upon request
On Request
1J1020
Wayne Kerr
1J1020
Test adapter for dielectric materials, 20 Hz - 30 MHz
Delivery time upon request
On Request
1J1023
Wayne Kerr
1J1023
4 to 2 BNC converter
Delivery time upon request
On Request

Alternate products

6440B
Wayne Kerr
6440B
Precision Component Analyzer, 20 Hz - 3 MHz
Delivery time upon request
On Request

About the Manufacturer

Wayne Kerr
Wayne Kerr
Wayne Kerr was founded in London (GB) in 1946 and developed into one of the leading manufacturers of measuring instruments in the electronics sector worldwide. Today, you will find Wayne Kerr wherever the highest precision and reliability are required: in automotive engineering, component manufacturing, medical technology and, of course, in universities and other educational institutions.
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