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Semiconductor and Component Test

Check here for parameter analyzers for characterizing materials, processes and semiconductor devices, source measure units for IV characterization of passive (currentless) components such as diodes, resistors and capacitors, and test systems for SiC (silicon carbide) and GaN (gallium nitride) power semiconductors. Find the right instrument for material and component characterizations in maintenance, design or quality control in our category Semiconductor and Component Test.

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510 products
N2852A
On Request
Delivery time upon request
TRX-1100V-2
€990.00
Delivery time upon request
N1254A-517
On Request
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11582A
On Request
Delivery time upon request
934-065-101
€8.25
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TL-7000-25M
-17 % €20.75 €25.00
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N9399C
On Request
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TA130
€31.00
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PM9092 / 001
-17 % €136.95 €165.00
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P01295451Z
€31.00
Ready to ship in 5 to 10 business days
TA340
€139.00
Delivery time upon request
1CN012A
On Request
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8101-PIV
€1,400.00
Delivery time upon request
P01295476
€149.00
Delivery time upon request
P01295454Z
€14.20
Ready to ship in 5 to 10 business days
P01295453Z
€33.00
Ready to ship in 5 to 10 business days
RT-ZA11
€21.00
Delivery time upon request