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Power Supplies and Loads
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EL4913A

Series

Keysight
EL4913A

Regenerative DC load, 80 V, 40 A, 2 kW, 200/520 VAC, LAN, USB, CAN IO

Measurement functions: Voltage Measurement, Current Measurement, Power Measurement, Energy Measurement / Regeneration, I/O Monitoring (Input/Output Monitoring)
AC input: 110 V - 520 V, 3P, 50 Hz / 60 Hz
Protective devices: OVP, OCP, OPP
max. Power (A): 40
max. voltage (V): 80
Mains feedback: Yes
Output power (W): 2000
Interfaces: LAN, USB Optional: GPIB

€4,800.00

Delivery time upon request

i34

Serie

Teledyne FLIR
i34

Thermal Imaging Camera, 240 x 320 px, 38° FOV, 30 Hz, -20° C to + 450° C, 40 mK, without LTE Module, iXX Series (18455-1101)

Focus: focus-free
Temperature measuring points: 76800
Smallest resolution IFOV (mrad): 2.9
Resolution in pixels: 240 x 320
Thermal sensitivity (mK): 40
Frame rate (Hz): 30
Max. field of view (FOV): 38° x 49°

€4,599.00

Delivery time upon request

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LabVIEW-Software-Seminar, Lernangebot für Studierende und Ingenieure

NI
Seminar LabVIEW Core 1

LabVIEW Core 1, 31.08.-02.09.2026 in Hamburg (LV1_HH_260831)

Seminar-Type: Face-to-face seminar
Postcode area: 20***
Seminar theme: LabView
Organiser: NI
Event Location: Hamburg area
Event Month: August;September

€2,790.00

LabVIEW-Software-Seminar, Lernangebot für Studierende und Ingenieure

NI
Seminar LabVIEW Core 2

LabVIEW Core 2, 03.-04.09.2026 in Hamburg (LV2_HH_260903)

Event Month: September
Seminar-Type: Face-to-face seminar
Postcode area: 20***
Seminar theme: LabView
Organiser: NI
Event Location: Hamburg area

€1,860.00

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Aerospace: Measurement Solutions for Critical Communications.

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Reading time 2 Min.

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Applications & Articles

Reduce Development Risks. Future-Proof Your Test Systems.

In safety-critical development and manufacturing processes, the test architecture determines quality, cost efficiency, a...

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48 Volt - Technology with a Future.

Increasing efficiency requirements in vehicles, data centers, and industry are driving new vehicle electrical system and...

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Reading time 8 Min.

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Semiconductor and Component Test

Semiconductor and Component Test

Check here for parameter analyzers for characterizing materials, processes and semiconductor devices, source measure units for IV characterization of passive (currentless) components such as diodes, resistors and capacitors, and test systems for SiC (silicon carbide) and GaN (gallium nitride) power semiconductors. Find the right instrument for material and component characterizations in maintenance, design or quality control in our category Semiconductor and Component Test.

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100 V - 240 V, 50 Hz / 60 Hz
100 V / 115 V / 230 V

No

No

LAN, USB, GPIB
USB, LAN
USB, LAN, RS-232
USB, LAN, RS-232, GPIB

1

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OVP, OCP, OPP, OTP
OVP, OCP, OTP
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