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Semiconductor and Component Test

Check here for parameter analyzers for characterizing materials, processes and semiconductor devices, source measure units for IV characterization of passive (currentless) components such as diodes, resistors and capacitors, and test systems for SiC (silicon carbide) and GaN (gallium nitride) power semiconductors. Find the right instrument for material and component characterizations in maintenance, design or quality control in our category Semiconductor and Component Test.

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506 products
RBU50
Rohde&Schwarz
RBU50
Power attenuator 50 W, 6 dB, 50 Ohm, DC to 2 GHz, Type-N (f) to Type-N (m) (1073.8695.06)
€1,800.00
Delivery time upon request
N2880A
Keysight
N2880A
In-line attenuator kit
On Request
Ready to ship in 5 to 10 business days
TA314
Pico
TA314
Adapter, SMA (f) to Type-N (m) 50 ohms, 18 GHz
€95.00
Delivery time upon request
J7204B
Keysight
J7204B
Attenuator, 4-channel, 0 to 121 dB, DC to 18 GHz, 1 dB steps
On Request
Delivery time upon request