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Semiconductor and Component Test

Check here for parameter analyzers for characterizing materials, processes and semiconductor devices, source measure units for IV characterization of passive (currentless) components such as diodes, resistors and capacitors, and test systems for SiC (silicon carbide) and GaN (gallium nitride) power semiconductors. Find the right instrument for material and component characterizations in maintenance, design or quality control in our category Semiconductor and Component Test.

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510 products
BP880
-17 % €19.92 €24.00
Delivery time upon request
973-592-100
€4.95
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8494A
On Request
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N1254A-103
On Request
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1CM001A
On Request
3 in stock. Ready to ship in 1 business day
XR25-0
€8.25
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D015540
€750.00
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934-072-101
€7.15
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N1254A-524
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11716A
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GTL-248
€153.00
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11716F
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934-095-101
€8.25
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2460-BAN
€634.00
1 in stock. Ready to ship in 1 business day
P01101841
€15.15
Delivery time upon request