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Semiconductor and Component Test

Check here for parameter analyzers for characterizing materials, processes and semiconductor devices, source measure units for IV characterization of passive (currentless) components such as diodes, resistors and capacitors, and test systems for SiC (silicon carbide) and GaN (gallium nitride) power semiconductors. Find the right instrument for material and component characterizations in maintenance, design or quality control in our category Semiconductor and Component Test.

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506 products
RS9010A-10
On Request
Delivery time upon request
973-592-100
€4.95
Delivery time upon request
8494A
On Request
Delivery time upon request
N1254A-103
On Request
Delivery time upon request
1CM001A
On Request
3 in stock. Ready to ship in 1 business day
1CP019A
On Request
Delivery time upon request
1CM069A
On Request
Delivery time upon request
XR25-0
€8.25
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D015540
€750.00
Delivery time upon request
934-072-101
€7.15
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N1254A-524
On Request
Delivery time upon request
1CM003A
On Request
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11716A
On Request
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GTL-248
€153.00
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TA337
€269.00
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11716F
On Request
Delivery time upon request
934-095-101
€8.25
Delivery time upon request
2460-BAN
€634.00
1 in stock. Ready to ship in 1 business day
P01101841
€15.40
Delivery time upon request
TRX-1100V-PCBCONN
€120.00
Delivery time upon request
TA308
€8.00
Delivery time upon request
ZV-Z92
On Request
Delivery time upon request
P01295457Z
€34.00
Ready to ship in 5 to 10 business days
NGU-B105
€460.00
Delivery time upon request