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Semiconductor and Component Test

Check here for parameter analyzers for characterizing materials, processes and semiconductor devices, source measure units for IV characterization of passive (currentless) components such as diodes, resistors and capacitors, and test systems for SiC (silicon carbide) and GaN (gallium nitride) power semiconductors. Find the right instrument for material and component characterizations in maintenance, design or quality control in our category Semiconductor and Component Test.

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506 products
783470-01
€82.00
Delivery time upon request
8494H
On Request
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1CM043A
On Request
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934-095-103
€8.25
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11742A
On Request
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1CP020A
On Request
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RS9010A-10M
On Request
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973-995-100
€10.45
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CS-210
On Request
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P01295094
€108.00
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934-069-102
€10.45
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TLK-225-1
-17 % €215.80 €260.00
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934-095-102
€8.25
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1CM010A
On Request
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2450-NFP
€7,470.00
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N6705C
€9,840.00
1 in stock. Ready to ship in 1 business day
TA338
€719.00
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4210-SMU
€15,400.00
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NGU-K106
€950.00
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1CP013A
On Request
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11716C
On Request
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1CM035A
On Request
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