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Manufacturer number: 1804.5000K02
The RT-ZISO Isolated Probing System from Rohde & Schwarz is a state-of-the-art probe measurement system specifically designed for measurements in high-voltage and high-frequency environments. Depending on the probe tip used, the probe offers precise measurements of differential voltages up to ±3,000 V at reference voltage levels of up to ±60 kV and a rise time of less than 450 ps. These features make it ideal for measuring power electronics that use wide-bandgap semiconductors (SiC, GaN), such as those found in modern inverters and motor controllers. The optical isolation of the system achieves an outstanding common mode rejection ratio (CMRR) of over 90 dB at 1 GHz, making it particularly suitable for demanding measurement environments with fast switching operations.
The probe offers a bandwidth of 100 MHz up to 1 GHz, which can be gradually extended by various upgrade options. It supports a differential input voltage of ±3,000 V as well as an offset range of ±60 kV, making it ideal for high voltage measurements in areas such as power electronics, inverter technology and motor control.
Bandwidth options include:
The system also offers dual connectivity with Rohde & Schwarz Probe Interface or SMA connectors, allowing it to be seamlessly integrated into existing measurement systems.
A variety of interchangeable probe tips are available for the probe head to cover different measurement requirements:
The accessories also include optical fiber cables in lengths of 3 m and 10 m to enable flexible measurement setups, especially in environments with high voltages and high interference noise.
The RT-ZISO probe system is certified to IEC/EN 61010-031 and offers a maximum input voltage range of 1,000 V RMS CAT III, ensuring safe use in high-voltage environments. In addition, the laser technology ensures safe and loss-free data transmission between the probe and receiver, while avoiding potentially dangerous feedback loops.
Product features: