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On 13 October 2026, NI and dataTec jointly invite you to NI Tech Day Hamburg 2026 at the Empire Riverside Hotel. The focus will be on current trends and technologies in test, measurement, and automation solutions. Application-oriented technical presentations by NI, dataTec, and leading technology partners will provide insights into artificial intelligence with Nigel, digital transformation, RF test solutions for military applications, cybersecurity, and current developments in the NI portfolio.
Look forward to practical insights, technical perspectives and the opportunity to discuss your individual questions with experts.
Free Participation | Limited Seats | Catering Included
Agenda.
| Time | Topic | Speaker & Brief Description |
|---|---|---|
| 08:30 – 09:00 | Get-together | |
| 09:00 – 09:35 | Opening | What's new at NI (DE) | Benedikt Gerlicher | Emerson Laura Le Cam | dataTec |
| 09:35 – 10:10 | NI Partner Shorts & Elevator Pitches (DE) | |
| 10:10 – 10:40 | Break & Networking | |
| 10:40 – 11:15 | Nigel AI – How AI Will Revolutionize Test Engineering (DE) | Stefan Kissel | Emerson Artificial intelligence is transforming the way test systems are developed, operated, and optimized. In this presentation, NI will demonstrate how AI can make test engineering more efficient, smarter, and future-proof. Through practical examples, learn how AI accelerates development processes, optimizes test workflows, and opens up new possibilities for automated testing. |
| 11:15 – 11:50 | NVH Testing for Electric Machines – From Measurement to Root Cause (DE) | Christian Göbel | AMC - Analytik und Messtechnik GmbH Chemnitz Electric machines present new challenges for developers and test engineers. High rotational speeds, complex electromagnetic interactions, and increasing demands on acoustics, comfort, and product quality make modern NVH (Noise, Vibration & Harshness) analyses a critical success factor. Using practical examples, participants will learn:
|
| 11:50 – 12:25 | HiL – Hardware-in-the-Loop for Everyone (DE) | Manuel Hofmann | Emerson Increasing product complexity, ever-growing amounts of software, and constantly changing requirements present new challenges for development and test teams. Hardware-in-the-Loop (HIL) offers the ability to conduct realistic testing early in the development process, detect errors more quickly, and shorten development cycles. This presentation demonstrates how HIL can be used not only as a testing tool but also as a key component of modern development processes. The focus is on early and continuous testing, rapid iterations, and flexible test systems that scale with a project’s requirements. Learn how HIL helps you test more, develop faster, and keep resources and costs under control at the same time. |
| 12:25 – 13:25 | Lunch & Networking | |
| 13:25 – 14:00 | CRA – The Impact of Cybersecurity on Test Engineering (DE) | Stefan Kissel | Emerson Cybersecurity regulations are being implemented in the U.S. and Europe. Their impact on test teams will significantly change the development of test systems. Learn how NI can help you with this. |
| 14:00 – 14:35 | Small Company, Big Threats (Cybersecurity for the rest of us) (DE) | Jörg Hampel | Hampel Software Engineering Cybersecurity is no longer an option — every digital product is facing increasing regulatory pressure, such as from the EU Cyber Resilience Act or the NIST Framework. At HSE, we have therefore launched an internal cybersecurity project to systematically address compliance requirements. In this presentation, we’ll use concrete examples to show what you need to prepare for, what challenges arise in practice, and what measures make sense. |
| 14:35 – 14:50 | Break & Networking | |
| 14:50 – 15:25 | NI Software-Defined Radio Technology at a Glance (DE) | Jan Schirok and Martin Anderseck | Emerson How does modern software-defined radio technology work, and what opportunities does it offer for development and testing? An R&D expert from NI provides direct insight into current SDR technologies, their applications, and the challenges involved in developing modern radio solutions. You can look forward to practical experiences and first-hand technical insights. |
| 15:25 – 16:00 | NI RF Applications with VST and USRP in the Automotive V2X Sector (DE) | Gerd Schmitz | S.E.A. NI’s RF measurement and software-defined radio (SDR) portfolio (USRP, VST family) is a valuable tool for efficiently addressing and solving project challenges in wireless technology. S.E.A. possesses extensive expertise in the implementation of communication algorithms and standards (such as Vehicle-to-Everything, V2X). The company’s comprehensive development, test, and measurement applications support the automated testing, validation, and production inspection of RF components. The presentation provides an overview and examples of various applications. |
| starting at 4 p.m. | Wrap-up & Networking |
The Countdown is On
Why Should You Attend.
- First-hand expertise from NI and dataTec experts
- Partner and hardware exhibition with insights into current solutions.
- Time for networking with colleagues from development, test and applications
- Networking breaks including drinks, snacks and lunch
Travel & Parking.
The event will take place in the Seminaris CampusHotel Berlin, Takusstr. 38, 14195 Berlin.
Travel by car:
On-site parking is available in the underground parking garage. The underground parking garage is located right next to the hotel.
Travel by public transport:
S-Bahn | S1 | Botanischer Garten > approx. 20-minute walk or by bus
U-Bahn | U3 | Dahlem-Dorf > approx. 3-minute walk
Bus | 101 / 110 / M11 / X83 | near CampusHotel
Register Free of Charge Now!
We will be happy to answer your questions by phone at +49 7121 / 51 50 50 or by email at events@datatec.eu
Note: Your registration data will be used to organize the event and for subsequent contact by National Instruments Corporation and dataTec AG.