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On 29 September 2026, NI and dataTec jointly invite you to NI Tech Day Hamburg 2026 at the Empire Riverside Hotel. The focus will be on current trends and technologies in test, measurement, and automation solutions. Application-oriented technical presentations by NI, dataTec, and leading technology partners will provide insights into artificial intelligence with Nigel, digital transformation, RF test solutions for military applications, cybersecurity, and current developments in the NI portfolio.
Look forward to practical insights, technical perspectives and the opportunity to discuss your individual questions with experts.
Free Participation | Limited Seats | Catering Included
Agenda.
| Time | Topic | Speaker & Brief Description |
|---|---|---|
| 08:30 – 09:00 | Get-together | |
| 09:00 – 09:35 | Opening | What's new at NI (DE) | Matteo Bax | NI Laura Le Cam | dataTec |
| 09:35 – 10:10 | NI Partner Short Presentations & Elevator Pitches (DE) | |
| 10:10 – 10:40 | Break & Networking | |
| 10:40 – 11:15 | Nigel AI: How AI Will Revolutionize Test Engineering (DE) | Stefan Kissel | Emerson Artificial intelligence is transforming the way test systems are developed, operated, and optimized. In this presentation, NI will demonstrate how AI can make test engineering more efficient, smarter, and future-proof. Through practical examples, learn how AI accelerates development processes, optimizes test workflows, and opens up new possibilities for automated testing. |
| 11:15 – 11:50 | From Legacy to AI-Enabled Testing Platforms (DE) | Jan Bartel | Eutech Scientific Engineering GmbH Many existing test benches are technologically outdated but continue to deliver valid and indispensable test results. This presentation demonstrates how such systems can be gradually modernized through targeted digital upgrades — without altering proven core processes. The focus is on data-oriented architectures, open interfaces, digital twins, and MCP-based integration concepts for connecting AI and automation solutions. This results in future-proof, networked, and AI-capable test platforms built on existing infrastructure. |
| 11:50 – 12:25 | AI-powered Testing (DE) | Thomas Rönpage | Werum Software & Systems AG Artificial intelligence has now found its way into nearly every company. AI capabilities can also deliver significant efficiency gains in testing. AI approaches based on large language models (LLMs), in particular, are ideally suited to supporting search functions and provide significantly improved usability, especially through the ability to use natural-language queries. |
| 12:25 – 13:25 | Lunch & Networking | |
| 13:25 – 14:00 | CRA – The Impact of Cybersecurity on Test Engineering (DE) | Stefan Kissel | Emerson Cybersecurity regulations are being implemented in the U.S. and Europe. Their impact on test teams will significantly change the development of test systems. Learn how NI can help you with this. |
| 14:00 – 14:35 | CRA – Practical Relevance of an Integration Partner (DE) | Kartsten Dallmeyer | Vikings The Cyber Resilience Act (CRA) imposes new cybersecurity requirements on products with digital components — and thus also on development and testing processes. In this presentation, an integration partner will draw on real-world experience to demonstrate the impact of the CRA on test systems and their development. Drawing on concrete examples, the presentation will highlight challenges, potential solutions, and key considerations for practical implementation. |
| 14:35 – 14:50 | Break & Networking | |
| 14:50 – 15:25 | NI Software-Defined Radio Technology at a Glance (DE) | Carsten Unger | Emerson How does modern software-defined radio technology work, and what opportunities does it offer for development and testing? An R&D expert from NI provides direct insight into current SDR technologies, their applications, and the challenges involved in developing modern radio solutions. You can look forward to practical experiences and first-hand technical insights. |
| 15:25 – 16:00 | Best Practices in RF and Wireless Device Testing (EN) | Matyas Süveg | Noffz Today in an AI-assisted world, it feels like we could do nearly anything. The build-vs-buy dilemma has always been there, but the limits are wide open now. It is becoming even more important to decide what we do, what we focus on, and what we choose to outsource. I'll bring examples of such decisions backed up by 4 decades of a System Integrator's experience with a special focus on RF- and Wireless Testing. Matyas Suveg, RnD Manager at NOFFZ, started working on cellular test solutions for the first LTE smartphones in Korea in 2010. Later, he helped transform this technology to the automotive industry by introducing high speed, multi-device production testing for eCall modules in Europe. Currently, his focus is on innovative product development to support validation and testing of new wireless communication standards for a wide range of technologies and devices in 5G/6G, V2X, UWB, BLE, Wi-Fi 7/8 and beyond. |
| starting at 4 p.m. | Wrap-up & Networking |
The Countdown is On
Why Should You Attend.
- First-hand expertise from NI and dataTec experts
- Partner and hardware exhibition with insights into current solutions.
- Time for networking with colleagues from development, test and applications
- Networking breaks including drinks, snacks and lunch
Travel & Parking.
The event will take place in the Empire Riverside Hotel, Bernhard-Nocht-Strasse 97, 20359 Hamburg, in the Ballroom.
Travel by car:
On-site parking is available in the public underground car park. The underground car park is located directly beneath the Empire Riverside Hotel.
Travel by public transport:
S-Bahn | S1 / S3 | Reeperbahn > approx. 7-minute walk
U-Bahn | U3 | St. Pauli > approx. 8-minute walk
Bus | 2 | St. Pauli Hafenstraße > approx. 3-minute walk
Register Free of Charge Now!
We will be happy to answer your questions by phone at +49 7121 / 51 50 50 or by email at events@datatec.eu
Note: Your registration data will be used to organize the event and for subsequent contact by National Instruments Corporation and dataTec AG.