LANGER XF-E 04S | E-field probe, 30 MHz to 6 GHz

Name: XF-E 04S | E-field probe, 30 MHz to 6 GHz
Brand: LANGER
SKU: XF-E 04S
Availability: InStock

Manufacturer number: XF-E 04S

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Langer XF-E 04S | E-field probe, 30 MHz to 6 GHz.

Product features:

Frequency range: 30 MHz - 6 GHz
Probe head dimensions: ≈ 5 x 5 mm
Connection - output: SMA, female, jack

Technical Data

Weight (kg):	0.02

Description

XF-E 04S | E-field probe, 30 MHz to 6 GHz

The near-field probe detects the electric fields that couple out of the measurement objects (ICs). The flanks of the probe head are shielded so that any E-field coming in from the side is not measured. The sensitivity of the near-field probe enables measurements at a distance of 0.5 mm to 10 mm above ICs and assemblies.

The XF-E 04s is a passive near-field probe. It has the same basic design as the XF-E 09s probe. To measure, the E-field probe is guided over or placed on the components or areas of the printed circuit board. The top and sides of the probe head are electrically shielded. The E-field probe has a sheath current attenuation. The near-field probe is connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The E-field probe has an internal terminating resistor.

About the Manufacturer

LANGER

Langer EMV-Technik is a German company specializing in research, development, production, and consulting in the field of electromagnetic compatibility, supporting developers with complex EMC challenges. The portfolio includes immunity development systems, near-field probes, IC test systems, EMC experiment systems, and positioning systems for electronics development, automotive, medical technology, aerospace, and communications technology.