The XJLink-PF40 from XJTAG is a compact, portable, and rugged USB-C-to-JTAG controller designed for quick access to electronic assemblies and devices under test. Its four ports provide a total of 40 freely configurable I/O pins and enable the parallel operation of up to eight independent JTAG TAPs. A separate clock frequency can be set for each JTAG chain, allowing components with different speeds to be tested efficiently and in sync.
Thanks to its compact design, the controller can be positioned directly next to the device under test. The rugged aluminum housing, the screw-lock USB-C connector, and the electrical protection of the I/O pins make the XJLink-PF40 suitable for use in development labs as well as in industrial production and test environments.
The pin assignments of the JTAG interfaces are configured via software. This allows the controller to be flexibly adapted to different printed circuit boards, connectors, and customer-specific pin assignments. Pins not required for JTAG can be used as general-purpose digital inputs and outputs, for fast programming of flash memory, for initiating test sequences, or for outputting test states.
Typical applications include boundary-scan tests, functional tests, and fault diagnosis on assembled printed circuit boards, the programming of flash memory, as well as JTAG- and SWD-based development and production testing. Since the XJTAG license is stored in the controller, the test system can be used flexibly with various desktop PCs or laptops and easily transported between the lab, production, and field use.
Product Features:
- Product Type: USB-C-to-JTAG Test Controller
- Manufacturer Part Number: XPF-0040
- Four JTAG ports with a total of 40 freely configurable I/O pins
- Support for up to eight independent JTAG TAPs or JTAG chains
- Individually configurable clock frequency for each JTAG chain
- Maximum TCK clock frequency: 166 MHz
- Support for JTAG and SWD
- Software-configurable connector and pin assignments
- Use of free pins as universal digital inputs and outputs
- Support for fast flash programming
- I/O pins can be used to trigger test sequences and output test status
- Four independently programmable I/O voltage ranges
- Adjustable I/O voltage: 1.2 V to 3.3 V in 0.1 V increments
- Protection of I/O pins against input voltages from -30 V to +30 V
- Integrated voltmeter on all I/O pins
- Voltmeter measurement range: 0 V to 3.3 V
- Integrated frequency counter on all I/O pins
- Frequency counter measurement range: 1 Hz to 200 MHz
- Selectable measurement time periods: 1 ms, 10 ms, 50 ms, 100 ms, 500 ms, 1 s, 5 s, and 10 s
- Automatic signal propagation time and skew compensation
- Visual test status indicator
- USB 2.0 interface
- Screw-lock USB-C connector
- Powered via the USB bus
- No external power supply required
- Integrated, device-specific XJTAG license
- Rugged aluminum housing
- Mounting options for integration into industrial test systems
- Suitable for laboratory, production, and mobile test applications
