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NI 783638-01 | NI PXIe-6591R, high-speed serial protocol meter (12.5 Gbps)

Manufacturer number: 783638-01

783638-01
783638-01
Delivery time upon request

€31,200.00

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Highlights Technical Data Documents / Downloads Description Related Articles

783638-01 | NI PXIe-6591R, high-speed serial protocol meter (12.5 Gbps).

Technical Data

Documents & Downloads

Catalog
PXI-Product-Catalog
pdf | 5.05 MB
Brochure
783638-01
pdf | 0.84 MB
Overview
PXI-Overview
pdf | 2.34 MB
Configuration guide
PXI-Overview
pdf | 1.88 MB

Description

783638-01 | NI PXIe-6591R, high-speed serial protocol meter (12.5 Gbps)

The PXIe ‑6591 is designed for applications where serial protocols should be validated, interfaced, and tested. It features a Xilinx Kintex ‑7 FPGA for implementing high speed serial protocols and is programmable in LabVIEW FPGA to make it optimally application specific can be defined and reused. The PXIe ‑6591 has an FPGA multigigabit transceiver and up to eight TX and RX lines. In addition to serial high-speed lanes, the PXIe ‑6591 offers digital I / O signals that support multiple logic families through a channel and cycle-by-cycle directional configuration.

Product features:

  • Bidirectional digital channels: 8
  • Maximum data rate: 12.5 Gbit / s
  • FPGA: Kintex-7 410T
  • Dynamic RAM (DRAM): 2 GB
  • PXI backplane connection: PCI-Express Gen2 x 8

Accessoires

Accessoires

NI
960680-100
Standard Service Program (SSP) for PXIe-6591, 3 Years (783638-01-S3)
Delivery time upon request
On Request

About the Manufacturer

NI
NI

NI stands for forward-looking hardware and software solutions in test and measurement technology and supports engineers and scientists in research, development, and production, for example in automotive, electronics, semiconductors, and aerospace. As a sales partner and the only Authorized Training Partner in Germany, dataTec offers expert consulting, a broad portfolio ranging from PXI systems to LabVIEW, and high-quality training through the dataTec Akademie.

Read more

News and Knowledge

TechTalk
The future of measurement technology: Intelligent test systems with NI

Laura Le Cam from dataTec talks to Oliver Bruder from NI about the current challenges and opportunities surrounding inte...

08/07/2025
Reading time 4 Min.
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