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YIC Technologies EMP-DBT-M | EMProbe basic device, main arm scanning range 250 mm and 180 °, 3-D precision scan for near field probes

Manufacturer number: EMP-DBT-M

EMP-DBT-M
EMP-DBT-M
EMP-DBT-M
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YIC Technologies EMP-DBT-M | EMProbe basic device, scanning range 250 mm and 180 °, physical resolution 0.25 mm for near field probes for EMC and EMI diagnosis.

Technical Data

Documents & Downloads

Datasheet
EMP-DBT-M
pdf | 0.53 MB
Start guide
EMP-DBT-M
pdf | 0.83 MB

Description

EMP-DBT-M | EMProbe basic device, main arm scanning range 250 mm and 180 °, 3-D precision scan for near field probes

With the YIC Technologies EMProbe, you can use portable near-field probes easier than ever before for exact and repeatable EMC and EMI diagnostics directly on your laboratory bench.

Thanks to 3D precision technology, you can examine circuit boards with narrow structures or small finished products and identify EMC / EMI problems using a robot-guided near-field probe. Using the EMViewer software, they control the robot arm and the probe attached to it in any direction, or combine the 3D analysis of the EMProbe with the 2D results of the well-known EMS scanners. An external spectrum analyzer is used to measure the signals, the visualization is done by the EMViewer software.

The solution can be scaled for larger scan areas. Just talk to us.

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About the Manufacturer

YIC Technologies
YIC Technologies

Y.I.C. Technologies is a leading provider of real-time EMC/EMI test solutions and helps engineers detect and resolve electromagnetic interference at an early stage. The portfolio includes EMScanner, EMScannerR, EMProbe, Near Field Probes Kit, and RFScanner for electronics design, antenna development, education, and research and development.

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