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NI 786320-01 | Digital Pattern Instrument PXIe-6571, 32 channels

Manufacturer number: 786320-01

786320-01
786320-01
Delivery time upon request

€26,800.00

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Highlights Technical Data Documents / Downloads Description Related Articles

NI 786320-01 | Digital Pattern Instrument PXIe-6571, 32 channels.

Technical Data

Documents & Downloads

Catalog
PXI-Product-Catalog
pdf | 5.05 MB
Brochure
785283-01
pdf | 5.32 MB
Overview
PXI-Overview
pdf | 1.35 MB
Configuration guide
PXI-Overview
pdf | 1.88 MB

Description

786320-01 | Digital Pattern Instrument PXIe-6571, 32 channels

The PXIe-6571 is suitable for characterization and production testing of semiconductor elements. It includes the Digital Pattern Editor for configuring pin assignments, specifications, levels, timing and patterns. The PXIe-6570 includes troubleshooting tools such as Shmoo plots, digital oscilloscopes, and interactive displays of RAM history, pin states, and system status. The PXIe-6571 requires a chassis with a cooling capacity of 82 W per slot, such as the PXIe-1095.

Product features:

  • Module width: 1
  • Maximum active load: 16 mA

Accessoires

Accessoires

NI
960680-100
Standard Service Program (SSP) for PXIe-6571, 3 Years (786320-01-S3)
Delivery time upon request
On Request
960451-04
NI
960451-04
ISO 17025 Calibration Certificate for PXIe-6571 (786320-01-ISO)
Delivery time upon request
€875.00
NI
960680-101
Standard Service Program (SSP) for PXIe-6571 with Traceable Calibration, 3 Years (786320-01-SC3)
Delivery time upon request
On Request
960451-03
NI
960451-03
ANSI Compliant Calibration Certificate for PXIe-6571 (786320-01-ANSI)
Delivery time upon request
€670.00
960451-01
NI
960451-01
Traceable Calibration Certificate for PXIe-6571 (786320-01-CAL)
Delivery time upon request
€440.00

About the Manufacturer

NI
NI
National Instruments is a global leader in test, measurement, and control solutions. NI's platform-based approach combines modular hardware and software to help customers address complex engineering challenges. Applications range from automotive, electronics, and energy to research/education and industrial systems.
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News and Knowledge

TechTalk
The future of measurement technology: Intelligent test systems with NI

Laura Le Cam from dataTec talks to Oliver Bruder from NI about the current challenges and opportunities surrounding inte...

08/07/2025
Reading time 4 Min.
78
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