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NI 785283-01 | PXIe-6570, Digital Pattern Instrument, 32 channels

Manufacturer number: 785283-01

785283-01
785283-01
Delivery time upon request

€26,800.00

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Highlights Technical Data Documents / Downloads Description Related Articles

785283-01 | PXIe-6570, Digital Pattern Instrument, 32 channels.

Technical Data

Documents & Downloads

Catalog
PXI-Product-Catalog
pdf | 5.05 MB
Brochure
785283-01
pdf | 5.32 MB
Overview
PXI-Overview
pdf | 1.35 MB
Configuration guide
PXI-Overview
pdf | 1.88 MB

Description

785283-01 | PXIe-6570, Digital Pattern Instrument, 32 channels

The PXIe ‑ 6570 is used for characterization and production testing in semiconductor technology. It includes the Digital Pattern Editor for configuring pin assignments, specifications, levels, timing and patterns. The PXIe ‑ 6570 includes troubleshooting tools such as Shmoo plots, digital oscilloscopes, and interactive displays of RAM history, system status, and pin conditions.

Product features:

  • Module width: 2
  • Maximum active load: 24 mA

Accessoires

Accessoires

NI
960680-100
Standard Service Program (SSP) for PXIe-6570, 3 Year (785283-01-S3)
Delivery time upon request
On Request
960451-03
NI
960451-03
ANSI Compliant Calibration Certificate for PXIe-6570 (785283-01-ANSI)
Delivery time upon request
€670.00
960680-101
NI
960680-101
Standard Service Program (SSP) for PXIe-6570 with Traceable Calibration, 3 Years (785283-01-SC3)
Delivery time upon request
€3,464.00
960451-01
NI
960451-01
Traceable Calibration Certificate for PXIe-6570 (785283-01-CAL)
Delivery time upon request
€440.00
960451-04
NI
960451-04
ISO 17025 Calibration Certificate for PXIe-6570 (785283-01-ISO)
Delivery time upon request
€875.00

About the Manufacturer

NI
NI
National Instruments is a global leader in test, measurement, and control solutions. NI's platform-based approach combines modular hardware and software to help customers address complex engineering challenges. Applications range from automotive, electronics, and energy to research/education and industrial systems.
Read more

News and Knowledge

TechTalk
The future of measurement technology: Intelligent test systems with NI

Laura Le Cam from dataTec talks to Oliver Bruder from NI about the current challenges and opportunities surrounding inte...

08/07/2025
Reading time 4 Min.
78
5

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