The probes from the XF1 set contain electrically shielded measuring heads, which were designed for high-frequency magnetic field measurements on electronic assemblies, components and IC pins.
The passive probes are connected to the 50 ohm input of a spectrum analyzer via cables with SMA connectors and enable comparative magnetic field and current measurements in the frequency range from 30 MHz to 6 GHz.
Near field probe set XF1
- H-field probe XF-R 400 - 1
- H-field probe XF-R 3 - 1
- H-field probe XF-U 2.5 - 1
- H-field probe XF-B 3 - 1
- E-field probe XF-E 10
- SMA-SMA cable
- Case (240 x 185 x 50) mm
- quick start Guide