LANGER XF-R 3-1 | H-field probe, 30 MHz to 6 GHz

Name: XF-R 3-1 | H-field probe, 30 MHz to 6 GHz
Brand: LANGER
SKU: XF-R 3-1
Availability: InStock

Manufacturer number: XF-R 3-1

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Langer XF-R 3-1 | H field probe, 30 MHz to 6 GHz.

Product features:

Frequency range: 30 MHz - 6 GHz
Resolution: ≈ 1 mm
Probe head dimensions: Ø ≈ 3 mm
Connection - output: SMA, female, jack
Weight: 15 g

Technical Data

Weight (kg):	0.02

Description

XF-R 3-1 | H-field probe, 30 MHz to 6 GHz

The XF-R 3-1 near-field probe is used to measure RF magnetic fields with high resolution directly on the component, e.g. in the area around pins and housings of ICs, traces, support capacitors and EMC components.

The XF-R 3-1 H-field probe has the same basic design as the XF-R 100-1 and XF-R 400-1 probes, but the resolution of the XF-R 3-1 is significantly higher. The H-field probe is suitable for measurements close to components in the area of high magnetic field strengths. It is not suitable for measurements at greater distances, such as those carried out with the XF-R 400-1 and the XF-R 100-1. The near-field probe is small and easy to handle. It has a sheath current attenuation and is electrically shielded. The near-field probe is connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe has an internal terminating resistor.

About the Manufacturer

LANGER

Langer EMV-Technik is a German company specializing in research, development, production, and consulting in the field of electromagnetic compatibility, supporting developers with complex EMC challenges. The portfolio includes immunity development systems, near-field probes, IC test systems, EMC experiment systems, and positioning systems for electronics development, automotive, medical technology, aerospace, and communications technology.