LANGER XF-R 100-1 | H-field probe, 30 MHz to 6 GHz

Name: XF-R 100-1 | H-field probe, 30 MHz to 6 GHz
Brand: LANGER
SKU: XF-R 100-1
Availability: InStock

Manufacturer number: XF-R 100-1

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Langer XF-R 100-1 | H-field probe, 30 MHz to 6 GHz.

Product features:

Frequency range: 30 MHz - 6 GHz
Resolution: Ø ≈10 mm
Probe head dimensions: ≈ 10x10 mm
Connection - output: SMA, female, jack

Technical Data

Weight (kg):	0.02

Description

XF-R 100-1 | H-field probe, 30 MHz to 6 GHz

The XF-R 100-1 H-field probe is suitable for measuring assemblies, devices or cables at a distance of up to approx. 3 cm. Larger components can be identified as interference sources with the H-field probe. The magnetic field probe offers a very high bandwidth and linearity.

The XF-R 100-1 is a passive near-field probe. The diameter of its probe head and therefore its sensitivity lie between the XF-R 400-1 (25 mm) and XF-R 3-1 (3 mm) near-field probes. The near-field probe is small and handy. It has a sheath current attenuation and is electrically shielded. The near-field probe is connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe has an internal terminating resistor.

About the Manufacturer

LANGER

Langer EMV-Technik is a German company specializing in research, development, production, and consulting in the field of electromagnetic compatibility, supporting developers with complex EMC challenges. The portfolio includes immunity development systems, near-field probes, IC test systems, EMC experiment systems, and positioning systems for electronics development, automotive, medical technology, aerospace, and communications technology.