In modern electronics development, short iteration cycles and reproducible measurement data determine how quickly a product passes the EMC test. With precise near-field analysis, unintended sources of interference, RF leaks and critical hotspots can be localized at an early stage - before expensive rework or external test runs become necessary.
Application areas:
- Pre-compliance EMC checks for early fault detection in the development phase
- Troubleshooting EMC/EMI problems (including intermittent effects) including verification after design changes
- High-speed, high-power and high-density PCBs as well as complex layouts with limited installation space
- Emission, immunity, filter and shielding tests (EMI shielding), broadband noise and common-mode analyses
- Component & assembly tests through to the analysis of non-planar surfaces or complete products
The Y.I.C. EMProbe-DBM-E6 is a computer-controlled EMC/EMI diagnostic system with a 6-axis robotic arm that makes near-field measurements significantly more precise and repeatable than conventional manual measurements. With a repeatability of 0.01 mm, it enables high-resolution spatial scans and reliable reproducibility of results - ideal for revealing the causes of interference emissions and directly comparing design iterations.
The system combines a robotic arm, near-field probes and a spectrum analyzer provided by the customer and is controlled via the EMViewer software. Spectrum analyzers with SCPI commands are supported. The software functions range from spectral and spatial scans, peak hold and continuous scanning to scripting, boundary lines and report generation. CAD overlays (Gerber, JPEG, PNG) make it easier to assign the measurement data to the layout and significantly speed up the root cause analysis.
For frequency coverage, Y.I.C. Technologies near-field probes are included; this enables measurements up to 14 GHz (depending on the probe used). For higher frequency ranges, the set also includes an E-field probe up to 18 GHz. The scanning surface is designed for use on the laboratory bench and offers a 450 mm radius for repeatable measurement sequences.
Product features:
- System type: Computer-controlled EMC/EMI diagnostic system with 6-axis robotic arm
- Repeatability: 0.01 mm
- Measurement/scan functions: Spectral Scan, Spatial Scan, Peak Hold, Continuous Scanning, Spectral & Spatial Comparison, Scripting, Limit Lines, Report Generation
- Supported Spectrum Analyzers: Devices with SCPI commands (via EMViewer)
- Software/OS: EMViewer software; supported operating system Windows 11
- CAD overlays: Standard Gerber, JPEG, PNG
- Frequency coverage (included Y.I.C.probes): up to 14 GHz
- Spatial resolution: 7.5 mm to 0.1 mm
- Scan range: 450 mm radius
- Frequency accuracy of peaks: depending on the peak marking accuracy of the spectrum analyzer
- Probe-to-Probe Uniformity: depending on the selected probe
- Max. Radiated Power Load: depending on spectrum analyzer and probe power
- Including near-field probes (set of 5, E- & H-field): HXY 10A02 (10 kHz-300 MHz), HXY 20A02 (100 kHz-1.4 GHz), HZ 40A02 (1-14 GHz), HXY 60A01 (1-13 GHz), E 00A02 (1.6-18 GHz)
