Keysight Application Note 5992-0681EN | Multiport and Multi-site Test Optimization Techniques

Application Note ::  Keysight Technologies Multiport and Multi-site Test Optimization Techniques

With the trend towards adding more ports on components, accurate and fast multiport network analysis is required. Optimizing your vector network analyzer (VNA) configuration is critical to minimizing manufacturing cost-of-test.

This application note provides an overview of multiport and multisite test capabilities, how different multiport test solutions compare, and what considerations need to be made when configuring a multi-site test station.

Table of Contents:

• Overview
• The Expanding Need for Multiport Testing
• Types of multiport solutions
• Simple switching test sets
• Full cross-bar switching test sets
• Extension test sets
• True multiport solutions
• Comparing multiport solutions
• Number of measurement sweeps
• Dynamic range
• Temperature stability
• Multiport calibration
• Mechanical calibration
• Electronic calibration (ECal)
• Multi-Site Techniques to Improve Throughput
• Considerations when configuring multi-site solutions
• Controller / CPU
• Backplane speed and memory
• PXI chassis
• Multi-display / multi-user
• Controller hardware
• Microsoft windows limitations
• Minimizing operator control time with macros
• Optimizing multiport testing with multi-site techniques
• Summary
• References